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PDF BYD33D Data sheet ( Hoja de datos )
| Número de pieza | BYD33D | |
| Descripción | Fast soft-recovery controlled avalanche rectifiers | |
| Fabricantes | NXP Semiconductors | |
| Logotipo |  |
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DISCRETE SEMICONDUCTORS
DATA SHEET
k, halfpage
M3D119
BYD33 series
Fast soft-recovery
controlled avalanche rectifiers
Product specification
Supersedes data of 1996 Jun 05
1996 Sep 18
1 page  
Philips Semiconductors
Fast soft-recovery
controlled avalanche rectifiers
GRAPHICAL DATA
1.6
handbook, halfpage
I F(AV)
(A)
1.2
lead length 10 mm
MGA857
Product specification
BYD33 series
1.6
handbook, halfpage
I F(AV)
(A)
1.2
lead length 10 mm
MLB905
0.8 0.8
0.4 0.4
0
0 100
BYD33D to M
a = 1.42; VR = VRRMmax; δ = 0.5.
Switched mode application.
T tp (oC)
200
Fig.2 Maximum permissible average forward
current as a function of tie-point temperature
(including losses due to reverse leakage).
0
0 100
BYD33U and V
a = 1.42; VR = VRRMmax; δ = 0.5.
Switched mode application.
T tp (oC)
200
Fig.3 Maximum permissible average forward
current as a function of tie-point temperature
(including losses due to reverse leakage).
1.2
handbook, halfpage
I F(AV)
(A)
0.8
MLB902
1.2
handbook, halfpage
I F(AV)
(A)
0.8
MLB906
0.4 0.4
0
0 100
BYD33D to M
a = 1.42; VR = VRRMmax; δ = 0.5.
Device mounted as shown in Fig.19.
Switched mode application.
Tamb (oC)
200
Fig.4 Maximum permissible average forward
current as a function of ambient temperature
(including losses due to reverse leakage).
0
0 100
BYD33U and V
a = 1.42; VR = VRRMmax; δ = 0.5.
Device mounted as shown in Fig.19.
Switched mode application.
Tamb (oC)
200
Fig.5 Maximum permissible average forward
current as a function of ambient temperature
(including losses due to reverse leakage).
1996 Sep 18
5
5 Page 
Philips Semiconductors
Fast soft-recovery
controlled avalanche rectifiers
Product specification
BYD33 series
handbook, full pagewidth
DUT
10 Ω
+
25 V
50 Ω
1Ω
IF
(A)
0.5
0
0.25
0.5
IR
(A)
1.0
t rr
t
MAM057
Input impedance oscilloscope: 1 MΩ, 22 pF; tr ≤ 7 ns.
Source impedance: 50 Ω; tr ≤ 15 ns.
Fig.21 Test circuit and reverse recovery time waveform and definition.
1996 Sep 18
11
11 Page | ||
| Páginas | Total 12 Páginas | |
| PDF Descargar | [ Datasheet BYD33D.PDF ] | |
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