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FDMC6679AZ PDF даташит
Спецификация FDMC6679AZ изготовлена «Fairchild Semiconductor» и имеет функцию, называемую «N-Channel MOSFET». |
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Детали детали
Номер произв | FDMC6679AZ |
Описание | N-Channel MOSFET |
Производители | Fairchild Semiconductor |
логотип | ![]() |
7 Pages

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FDMC6679AZ
P-Channel PowerTrench® MOSFET
-30 V, -20 A, 10 mΩ
Features
Max rDS(on) = 10 mΩ at VGS = -10 V, ID = -11.5 A
Max rDS(on) = 18 mΩ at VGS = -4.5 V, ID = -8.5 A
HBM ESD protection level of 8 kV typical(note 3)
Extended VGSS range (-25 V) for battery applications
High performance trench technology for extremely low rDS(on)
High power and current handling capability
Termination is Lead-free and RoHS Compliant
July 2009
General Description
The FDMC6679AZ has been designed to minimize losses in
load switch applications. Advancements in both silicon and
package technologies have been combined to offer the lowest
rDS(on) and ESD protection.
Applications
Load Switch in Notebook and Server
Notebook Battery Pack Power Management
Top Bottom
Pin 1
S SG
S
MLP 3.3x3.3
DD
D
D
D5
D6
D7
D8
4G
3S
2S
1S
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted
www.DataSheetS4Uym.cbomol
VDS
VGS
ID
PD
TJ, TSTG
Parameter
Drain to Source Voltage
Gate to Source Voltage
Drain Current -Continuous (Package limited)
-Continuous (Silicon limited)
-Continuous
-Pulsed
TC = 25 °C
TC = 25 °C
TA = 25 °C
Power Dissipation
TC = 25 °C
Power Dissipation
TA = 25 °C
Operating and Storage Junction Temperature Range
Thermal Characteristics
(Note 1a)
(Note 1a)
Ratings
-30
±25
-20
-51
-11.5
-32
41
2.3
-55 to +150
Units
V
V
A
W
°C
RθJC
RθJA
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Ambient
Package Marking and Ordering Information
(Note 1a)
3
53
°C/W
Device Marking
FDMC6679AZ
Device
FDMC6679AZ
Package
MLP 3.3x3.3
Reel Size
13 ’’
Tape Width
12 mm
Quantity
3000 units
©2009 Fairchild Semiconductor Corporation
FDMC6679AZ Rev.D1
1
www.fairchildsemi.com

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Electrical Characteristics TJ = 25 °C unless otherwise noted
Symbol
Parameter
Test Conditions
Min Typ Max Units
Off Characteristics
BVDSS
∆BVDSS
∆TJ
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
IDSS Zero Gate Voltage Drain Current
IGSS
Gate to Source Leakage Current
ID = -250 µA, VGS = 0 V
ID = -250 µA, referenced to 25 °C
VDS = -24 V,
VGS = 0 V,
TJ = 125 °C
VGS = ±25 V, VDS = 0 V
-30 V
29 mV/°C
-1
-100
±10
µA
µA
On Characteristics
VGS(th)
Gate to Source Threshold Voltage
VGS = VDS, ID = -250 µA
-1 -1.8 -3
V
∆VGS(th)
∆TJ
Gate to Source Threshold Voltage
Temperature Coefficient
ID = -250 µA, referenced to 25 °C
-7 mV/°C
VGS = -10 V, ID = -11.5 A
8.6 10
rDS(on)
Static Drain to Source On Resistance VGS = -4.5 V, ID = -8.5 A
12 18 mΩ
VGS = -10 V, ID = -11.5 A, TJ = 125 °C
12 15
gFS Forward Transconductance
VDS = -5 V, ID = -11.5 A
46 S
Dynamic Characteristics
Ciss
Coss
Crss
Rg
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
VDS = -15 V, VGS = 0 V,
f = 1 MHz
2985
570
500
4.3
3970
755
750
pF
pF
pF
Ω
Switching Characteristics
td(on)
tr
td(off)
tf
Qg
Qg
Qgs
www.DataShQeegdt4U.com
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Total Gate Charge
Gate to Source Charge
Gate to Drain “Miller” Charge
VDD = -15 V, ID = -11.5 A,
VGS = -10 V, RGEN = 6 Ω
VGS = 0 V to -10 V
VGS = 0 V to -5 V
VDD = -15 V,
ID = -11.5 A
12 21 ns
14 25 ns
63 100 ns
46 73 ns
65 91 nC
37 52 nC
8.7 nC
17 nC
Drain-Source Diode Characteristics
VSD
Source to Drain Diode Forward Voltage VGS = 0 V, IS = -11.5 A
VGS = 0 V, IS = -1.6 A
(Note 2)
(Note 2)
trr Reverse Recovery Time
Qrr Reverse Recovery Charge
IF = -11.5 A, di/dt = 100 A/µs
0.83
0.71
31
16
1.30
1.20
49
28
V
ns
nC
NOTES:
1. RθJA is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJC is guaranteed by design while RθCA is determined by
the user's board design.
a. 53 °C/W when mounted on
a 1 in2 pad of 2 oz copper
b.125 °C/W when mounted on
a minimum pad of 2 oz copper
2. Pulse Test: Pulse Width < 300 µs, Duty cycle < 2.0 %.
3. The diode connected between the gate and source servers only as protection against ESD. No gate overvoltage rating is implied.
©2009 Fairchild Semiconductor Corporation
FDMC6679AZ Rev.D1
2
www.fairchildsemi.com

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Typical Characteristics TJ = 25 °C unless otherwise noted
32
24
16
8
0
0
VGS = -10 V
VGS = -6 V
VGS = -4.5 V
VGS = -4 V
VGS = -3.5 V
VGS = -3 V
PULSE DURATION = 80 µs
DUTY CYCLE = 0.5% MAX
12
-VDS, DRAIN TO SOURCE VOLTAGE (V)
3
Figure 1. On Region Characteristics
4
VGS = -3 V
PULSE DURATION = 80 µs
DUTY CYCLE = 0.5% MAX
3
VGS = -3.5 V
2
VGS = -4 V
VGS = -4.5 V
1
VGS = -6 V
VGS = -10 V
0 8 16 24 32
-ID, DRAIN CURRENT (A)
Figure 2. Normalized On-Resistance
vs Drain Current and Gate Voltage
1.6
ID = -11.5 A
VGS = -10 V
1.4
1.2
1.0
0.8
0.6
-75 -50 -25 0 25 50 75 100 125 150
TJ, JUNCTION TEMPERATURE (oC)
www.DataSheet4U.coFmigure 3. Normalized On Resistance
vs Junction Temperature
50
ID = -11.5 A
PULSE DURATION = 80 µs
DUTY CYCLE = 0.5% MAX
40
30
20
10
0
2
TJ = 125 oC
TJ = 25 oC
468
-VGS, GATE TO SOURCE VOLTAGE (V)
Figure 4. On-Resistance vs Gate to
Source Voltage
10
32
PULSE DURATION = 80 µs
DUTY CYCLE = 0.5% MAX
24 VDS = -5 V
16
8
0
1
TJ = 25 oC
TJ = 150 oC
TJ = -55 oC
23
-VGS, GATE TO SOURCE VOLTAGE (V)
4
Figure 5. Transfer Characteristics
40
10 VGS = 0 V
1 TJ = 150 oC
0.1
TJ = 25 oC
0.01
TJ = -55 oC
0.001
0.0
0.2 0.4 0.6 0.8 1.0
-VSD, BODY DIODE FORWARD VOLTAGE (V)
1.2
Figure 6. Source to Drain Diode
Forward Voltage vs Source Current
©2009 Fairchild Semiconductor Corporation
FDMC6679AZ Rev.D1
3
www.fairchildsemi.com

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