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FDG410NZ PDF даташит
Спецификация FDG410NZ изготовлена «Fairchild Semiconductor» и имеет функцию, называемую «N-Channel MOSFET». |
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Детали детали
Номер произв | FDG410NZ |
Описание | N-Channel MOSFET |
Производители | Fairchild Semiconductor |
логотип | ![]() |
7 Pages

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FDG410NZ
Single N-Channel PowerTrench® MOSFET
20 V, 2.2 A, 70 mΩ
March 2009
Features
General Description
Max rDS(on) = 70 mΩ at VGS = 4.5 V, ID = 2.2 A
Max rDS(on) = 77 mΩ at VGS = 2.5 V, ID = 2.0 A
Max rDS(on) = 87 mΩ at VGS = 1.8 V, ID = 1.8 A
Max rDS(on) = 115 mΩ at VGS = 1.5 V, ID = 1.5 A
HBM ESD protection level > 2 kV (Note 3)
High performance trench technology for extremely low rDS(on)
High power and current handling capability
Fast switching speed
This N-Channel MOSFET has been designed specifically to
improve the overall efficiency of DC/DC converters using either
synchronous or conventional switching PWM controllers. It has
been optimized use in small switching regulaters, providing an
extremely low rDS(on) and gate charge (Qg) in a small package.
Applications
DC/DC converter
Power management
Load switch
Low gate charge
RoHS Compliant
DS
D
D1
6D
G
D
D
D2
G3
5D
4S
www.DataSheet4U.com
SC70-6
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted
Symbol
VDS
VGS
ID
PD
TJ, TSTG
Parameter
Drain to Source Voltage
Gate to Source Voltage
-Continuous
-Pulsed
TA = 25 °C
Power Dissipation
TA = 25 °C
Power Dissipation
TA = 25 °C
Operating and Storage Junction Temperature Range
Thermal Characteristics
(Note 1a)
(Note 1a)
(Note 1b)
Ratings
20
±8
2.2
6.0
0.42
0.38
-55 to +150
Units
V
V
A
W
°C
RθJA
RθJA
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Package Marking and Ordering Information
(Note 1a)
(Note 1b)
300
333
°C/W
Device Marking
.41
Device
FDG410NZ
Package
SC70-6
Reel Size
7”
Tape Width
8 mm
Quantity
3000 units
©2009 Fairchild Semiconductor Corporation
FDG410NZ Rev.B
1
www.fairchildsemi.com

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Electrical Characteristics TJ = 25 °C unless otherwise noted
Symbol
Parameter
Test Conditions
Min Typ Max Units
Off Characteristics
BVDSS
∆BVDSS
∆TJ
IDSS
IGSS
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate to Source Leakage Current
ID = 250 µA, VGS = 0 V
ID = 250 µA, referenced to 25 °C
VDS = 16 V, VGS = 0 V
VGS = ±8 V, VDS = 0 V
20
V
17 mV/°C
1 µA
±10 µA
On Characteristics
VGS(th)
∆VGS(th)
∆TJ
Gate to Source Threshold Voltage
Gate to Source Threshold Voltage
Temperature Coefficient
rDS(on)
Static Drain to Source On Resistance
gFS Forward Transconductance
VGS = VDS, ID = 250 µA
0.4 0.7 1.0
V
ID = 250 µA, referenced to 25 °C
-3 mV/°C
VGS = 4.5 V, ID = 2.2 A
VGS = 2.5 V, ID = 2.0 A
VGS = 1.8 V, ID = 1.8 A
VGS = 1.5 V, ID = 1.5 A
VGS = 4.5 V, ID = 2.2 A,
TJ = 125 °C
VDD = 5 V, ID = 2.2 A
50 70
56 77
67 87 mΩ
83 115
71 100
11 S
Dynamic Characteristics
Ciss
Coss
Crss
Rg
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
VDS = 10 V, VGS = 0 V,
f = 1 MHz
400 535
70 95
45 70
2.8
pF
pF
pF
Ω
Switching Characteristics
td(on)
tr
td(off)
tf
Qg
Qgs
www.DataShQeegdt4U.com
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate to Source Charge
Gate to Drain “Miller” Charge
VDD = 10 V, ID = 2.2 A,
VGS = 4.5 V, RGEN = 6 Ω
VGS = 4.5 V, VDD = 10 V,
ID = 2.2 A
5.3 11 ns
2.3 10
ns
18 33 ns
2.3 10
ns
5.1 7.2 nC
0.6 nC
1.0 nC
Drain-Source Diode Characteristics
IS Maximum Continuous Drain-Source Diode Forward Current
VSD Source to Drain Diode Forward Voltage VGS = 0 V, IS = 0.35 A (Note 2)
trr Reverse Recovery Time
Qrr Reverse Recovery Charge
IF = 2.2 A, di/dt = 100 A/µs
0.35 A
0.6 1.2
V
11 20 ns
2.5 10 nC
Notes:
1. RθJA is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJC is guaranteed by design while RθJA is determined by
the user's board design.
a. 300 °C/W when mounted
on a 1 in2 pad of 2 oz copper.
b. 333 °C/W when mounted on a
minimum pad of 2 oz copper.
2. Pulse Test: Pulse Width < 300 µs, Duty cycle < 2.0%.
3: The diode connected between the gate and source serves only as protection against ESD. No gate overvoltage rating is implied.
©2009 Fairchild Semiconductor Corporation
FDG410NZ Rev.B
2
www.fairchildsemi.com

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Typical Characteristics TJ = 25 °C unless otherwise noted
6
VGS = 4.5 V
5
4
3
2
VGS = 3.5 V
VGS = 2.5 V
VGS = 1.8 V
VGS = 1.5 V
PULSE DURATION = 80 µs
DUTY CYCLE = 0.5% MAX
1
0
0 0.2 0.4 0.6 0.8 1.0
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 1. On Region Characteristics
2.5
VGS = 1.5 V
2.0
VGS = 1.8 V
1.5
VGS = 3.5 V VGS = 2.5 V
1.0
0.5
1
PULSE DURATION = 80 µs
DUTY CYCLE = 0.5% MAX
234
ID, DRAIN CURRENT (A)
VGS = 4.5 V
56
Figure 2. Normalized On-Resistance
vs Drain Current and Gate Voltage
1.6
ID = 2.2 A
VGS = 4.5 V
1.4
1.2
1.0
0.8
0.6
-75 -50 -25 0 25 50 75 100 125 150
TJ, JUNCTION TEMPERATURE (oC)
www.DataSheet4U.coFmigure 3. Normalized On Resistance
vs Junction Temperature
6
PULSE DURATION = 80 µs
5 DUTY CYCLE = 0.5% MAX
VDS = 5 V
4
3
2
TJ = 125 oC
TJ = 25 oC
1
TJ = -55 oC
0
0.0 0.5 1.0 1.5 2.0
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics
180
PULSE DURATION = 80 µs
160 DUTY CYCLE = 0.5% MAX
140 ID = 1.1 A
120
100
TJ = 125 oC
80
60 TJ = 25 oC
40
1.0
1.5 2.0 2.5 3.0 3.5 4.0
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 4. On-Resistance vs Gate to
Source Voltage
4.5
6
VGS = 0 V
1
TJ = 125 oC
0.1
TJ = 25 oC
TJ = -55 oC
0.01
0.2
0.4 0.6 0.8 1.0
VSD, BODY DIODE FORWARD VOLTAGE (V)
1.2
Figure 6. Source to Drain Diode
Forward Voltage vs Source Current
©2009 Fairchild Semiconductor Corporation
FDG410NZ Rev.B
3
www.fairchildsemi.com

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