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93AA86-P PDF даташит

Спецификация 93AA86-P изготовлена ​​​​«Microchip Technology» и имеет функцию, называемую «8K/16K 1.8V Microwire Serial EEPROM».

Детали детали

Номер произв 93AA86-P
Описание 8K/16K 1.8V Microwire Serial EEPROM
Производители Microchip Technology
логотип Microchip Technology логотип 

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93AA86-P Даташит, Описание, Даташиты
93AA76/86
8K/16K 1.8V Microwire® Serial EEPROM
FEATURES
• Single supply operation down to 1.8V
• Low power CMOS technology
- 1 mA active current typical
- 5 µA standby current (typical) at 3.0V
• ORG pin selectable memory configuration
- 1024 x 8 or 512 x 16-bit organization
(93AA76)
- 2048 x 8 or 1024 x 16-bit organization
(93AA86)
• Self-timed ERASE and WRITE cycles
• Automatic ERAL before WRAL
• Power on/off data protection circuitry
• Industry standard 3-wire serial I/O
• Device status signal during ERASE/WRITE cycles
• Sequential READ function
• 10,000,000 ERASE/WRITE cycles guaranteed
• Data retention > 200 years
• 8-pin PDIP/SOIC package
• Temperature ranges available:
- Commercial (C): 0°C to +70°C
DESCRIPTION
The Microchip Technology Inc. 93AA76/86 are 8K and
16K low voltage serial Electrically Erasable PROMs.
The device memory is configured as x8 or x16 bits
depending on the ORG pin setup. Advanced CMOS
technology makes these devices ideal for low power
non-volatile memory applications. These devices also
have a Program Enable (PE) pin to allow the user to
write protect the entire contents of the memory array.
The 93AA76/86 is available in standard 8-pin DIP and
8-pin surface mount SOIC packages.
PACKAGE TYPES
DIP Package
CS 1
CLK 2
DI 3
DO 4
8 VCC
7 PE
6 ORG
5 VSS
SOIC Package
CS 1
CLK 2
DI 3
DO 4
8 VCC
7 PE
6 ORG
5 VSS
BLOCK DIAGRAM
VCC VSS
Memory
Array
Address
Decoder
Data
Register
DI
Mode
PE
CS
Decode
Logic
CLK
Clock
Generator
Address
Counter
Output
Buffer
DO
Microwire is a registered trademark of National Semiconductor Incorporated.
© 1996 Microchip Technology Inc.
Preliminary
This document was created with FrameMaker 4 0 4
DS21130C-page 1









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93AA86-P Даташит, Описание, Даташиты
93AA76/86
1.0 ELECTRICAL CHARACTERISTICS
1.1 Maximum Ratings*
VCC ..................................................................................7.0V
All inputs and outputs w.r.t. VSS ............... -0.6V to Vcc +1.0V
Storage temperature ..................................... -65˚C to +150˚C
Ambient temp. with power applied................. -65˚C to +125˚C
Soldering temperature of leads (10 seconds) ............. +300˚C
ESD protection on all pins................................................4 kV
*Notice: Stresses above those listed under “Maximum ratings”
may cause permanent damage to the device. This is a stress rat-
ing only and functional operation of the device at those or any
other conditions above those indicated in the operational listings
of this specification is not implied. Exposure to maximum rating
conditions for extended periods may affect device reliability
TABLE 1-1: PIN FUNCTION TABLE
Name
CS
CLK
DI
DO
VSS
ORG
PE
VCC
Function
Chip Select
Serial Data Clock
Serial Data Input
Serial Data Output
Ground
Memory Configuration
Program Enable
Power Supply
1.2 AC Test Conditions
AC Waveform:
VLO = 2.0V
VHI = Vcc - 0.2V
VHI = 4.0V for
(Note 1)
(Note 2)
Timing Measurement Reference Level
Input
0.5 VCC
Output
0.5 VCC
Note 1: For VCC 4.0V
2: For VCC > 4.0V
TABLE 1-2: DC CHARACTERISTICS
Applicable over recommended operating ranges shown below unless otherwise noted:
VCC = +1.8V to +6.0V
Commercial (C): Tamb = 0˚C to +70˚C
Parameter
Symbol
Min.
Max.
Units Conditions
High level input voltage VIH1 2.0 VCC +1 V
VIH2
0.7 VCC VCC +1
V
Low level input voltage
VIL1 -0.3 0.8
V
VIL2
-0.3 0.2 VCC
V
Low level output voltage
VOL1
0.4
V
VOL2
0.2 V
High level output voltage
VOH1
2.4
V
VOH2
VCC-0.2
V
Input leakage current
ILI -10 10 µA
Output leakage current ILO -10 10 µA
Pin capacitance
(all inputs/outputs)
CINT
7 pF
Operating current
ICC write
3 mA
ICC read
1 mA
500 µA
Standby current
ICCS — 100 µA
30 µA
Note: This parameter is periodically sampled and not 100% tested.
VCC 2.7V
VCC < 2.7V
VCC 2.7V
VCC < 2.7V
IOL = 2.1 mA; VCC = 4.5V
IOL =100 µA; VCC = VCC Min.
IOH = -400 µA; VCC = 4.5V
IOH = -100 µA; VCC = VCC Min.
VIN = 0.1V to VCC
VOUT = 0.1V to VCC
(Note Note:)
Tamb = +25˚C, FCLK = 1 MHz
VCC = 5.5V
FCLK = 3 MHz; VCC = 5.5V
FCLK = 1 MHz; VCC = 3.0V
CLK = CS = 0V; VCC = 5.5V
CLK = CS = 0V; VCC = 3.0V
DS21130C-page 2
Preliminary
© 1996 Microchip Technology Inc.









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93AA86-P Даташит, Описание, Даташиты
93AA76/86
TABLE 1-3: AC CHARACTERISTICS
Applicable over recommended operating ranges shown below unless otherwise noted:
VCC = +1.8V to +6.0V
Commercial (C): Tamb = 0˚C to +70˚C
Parameter
Symbol
Min.
Max.
Units Conditions
Clock frequency
FCLK
— 3 MHz 4.5V VCC 6.0V
2 MHz 2.5V VCC 4.5V
1 Mhz 1.8V VCC < 2.5V
Clock high time
TCKH
200 — ns 4.5V VCC 6.0V
300 ns 2.5V VCC < 4.5V
500 ns 1.8V VCC < 2.5V
Clock low time
TCKL
100 — ns 4.5V VCC 6.0V
200 ns 2.5V VCC < 4.5V
500 ns 1.8V VCC < 2.5V
Chip select setup time
TCSS
50 — ns 4.5V VCC 6.0V, Relative to CLK
100 ns 2.5V VCC < 4.5V, Relative to CLK
250 ns 1.8V VCC < 2.5V, Relative to CLK
Chip select hold time
TCSH
0 — ns 1.8V VCC 6.0V
Chip select low time
TCSL
250 — ns 1.8V VCC 6.0V, Relative to CLK
Data input setup time
TDIS
50 — ns 4.5V VCC 6.0V, Relative to CLK
100 ns 2.5V VCC <4.5V, Relative to CLK
250 ns 1.8V VCC < 2.5V, Relative to CLK
Data input hold time
TDIH
50 — ns 4.5V VCC 6.0V, Relative to CLK
100 ns 2.5V VCC < 4.5V, Relative to CLK
250 ns 1.8V VCC < 2.5V, Relative to CLK
Data output delay time
TPD
— 100 ns 4.5V VCC 6.0V, CL = 100 pF
250 ns 2.5V VCC < 4.5V, CL = 100 pF
500 ns 1.8V VCC < 2.5V, CL = 100 pF
Data output disable time TCZ
— 100 ns 4.5V VCC 5.5V (Note 1)
500 ns 1.8V VCC < 4.5V (Note 1)
Status valid time
TSV
— 200 ns 4.5V VCC 6.0V, CL = 100 pF
300 ns 2.5V VCC < 4.5V, CL = 100 pF
500 ns 1.8V VCC < 2.5V, CL = 100 pF
Program cycle time
TWC
— 5 ms ERASE/WRITE mode
TEC — 15 ms ERAL mode
TWL — 30 ms WRAL mode
Endurance
10M
— cycles 25°C, VCC = 5.0V, Block Mode
(Note 2)
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific
application, please consult the Total Endurance Model which can be obtained on our BBS or website.
© 1996 Microchip Technology Inc.
Preliminary
DS21130C-page 3










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