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PDF 7LVC544APWDH Data sheet ( Hoja de datos )

Número de pieza 7LVC544APWDH
Descripción Octal D-type registered transceiver/ inverting 3-State
Fabricantes NXP Semiconductors 
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No Preview Available ! 7LVC544APWDH Hoja de datos, Descripción, Manual

INTEGRATED CIRCUITS
74LVC544A
Octal D-type registered transceiver,
inverting (3-State)
Product specification
1998 Jul 29
Philips
Semiconductors

1 page




7LVC544APWDH pdf
Philips Semiconductors
Octal D-type registered transceiver, inverting
(3-State)
Product specification
74LVC544A
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VI
VO
Tamb
tr, tf
DC supply voltage (for max. speed performance)
DC supply voltage (for low-voltage applications)
DC input voltage range
DC output voltage range; output HIGH or LOW state
DC output voltage range; output 3-State
Operating free-air temperature range
Input rise and fall times
CONDITIONS
VCC = 1.2 to 2.7V
VCC = 2.7 to 3.6V
LIMITS
MIN MAX
2.7 3.6
1.2 3.6
0 5.5
0 VCC
0 5.5
–40 +85
0 20
0 10
UNIT
V
V
V
°C
ns/V
ABSOLUTE MAXIMUM RATINGS1
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC DC supply voltage
IIK DC input diode current
VI t0
VI DC input voltage
Note 2
IOK DC output diode current
VO uVCC or VO t 0
DC output voltage; output HIGH or LOW
Note 2
VO DC output voltage; output 3-State
Note 2
–0.5 to +6.5
–50
–0.5 to +6.5
"50
–0.5 to VCC +0.5
–0.5 to 6.5
V
mA
V
mA
V
V
IO DC output source or sink current
VO = 0 to VCC
"50
mA
IGND, ICC
Tstg
PTOT
DC VCC or GND current
Storage temperature range
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and
TSSOP)
above +70°C derate linearly with 8 mW/K
above +60°C derate linearly with 5.5 mW/K
"100
–65 to +150
500
500
mA
°C
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Jul 29
5

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