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100302F PDF даташит

Спецификация 100302F изготовлена ​​​​«National Semiconductor» и имеет функцию, называемую «Low Power Quint 2-Input OR/NOR Gate».

Детали детали

Номер произв 100302F
Описание Low Power Quint 2-Input OR/NOR Gate
Производители National Semiconductor
логотип National Semiconductor логотип 

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100302F Даташит, Описание, Даташиты
August 1998
100302
Low Power Quint 2-Input OR/NOR Gate
General Description
The 100302 is a monolithic quint 2-input OR/NOR gate with
common enable. All inputs have 50 kpull-down resistors
and all outputs are buffered.
Features
n 43% power reduction of the 100102
n 2000V ESD protection
n Pin/function compatible with 100102
n Voltage compensated operating range = −4.2V to −5.7V
n Standard Microcircuit Drawing
(SMD) 5962-9152802
Logic Symbol
DS100303-1
Pin Names
Dna– Dne
E
Oa– Oe
Oa– Oe
Description
Data Inputs
Enable Input
Data Outputs
Complementary Data Outputs
Truth Table
D1X D2X E OX OX
L L LL H
L L HH L
L H LH L
L H HH L
H L LH L
H L HH L
H H LH L
H H HH L
H = HIGH Voltage Level
L = LOW Voltage Level
© 1998 National Semiconductor Corporation DS100303
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100302F Даташит, Описание, Даташиты
Connection Diagrams
24-Pin DIP
DS100303-2
24-Pin Quad Cerpak
DS100303-3
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100302F Даташит, Описание, Даташиты
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired
Storage Temperature (TSTG)
Maximum Junction Temperature (TJ)
Ceramic
−65˚C to +150˚C
+175˚C
VEE Pin Potential to
Ground Pin
−7.0V to +0.5V
Input Voltage (DC)
Output Current (DC Output HIGH)
VEE to +0.5V
−50 mA
ESD (Note 2)
2000V
Recommended Operating
Conditions
Case Temperature (TC)
Military
−55˚C to +125˚C
Supply Voltage (VEE)
−5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C (Note 5)
Symbol
Parameter
VOH Output HIGH Voltage
Min
−1025
−1085
Max
−870
−870
Units
mV
mV
TC
0˚C to +125˚C
−55˚C
VOL Output LOW Voltage −1830 −1620 mV 0˚C to +125˚C
−1830 −1555 mV
−55˚C
VOHC
Output HIGH Voltage
−1035
−1085
mV 0˚C to +125˚C
mV −55˚C
VOLC Output LOW Voltage
−1610 mV
−1555 mV
0˚C to +125˚C
−55˚C
VIH
Input HIGH Voltage
−1165 −870 mV −55˚C to +125˚C
VIL Input LOW Voltage −1830 −1475 mV −55˚C to +125˚C
IIL Input LOW Current 0.50
µA −55˚C to +125˚C
IIH Input HIGH Current
240 µA
340 µA
0˚C to +125˚C
−55˚C
IEE Power Supply Current −48 −17 mA −55˚C to +125˚C
Conditions
VIN = VIH(Max)
or VIL (Min)
Loading with
50to −2.0V
VIN = VIH(Max)
or VIL (Min)
Loading with
50to −2.0V
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
VEE = −4.2V
VIN = VIH (Max)
VEE = −5.7V
VIN = VIL(Min)
Inputs Open
Notes
(Notes 3, 4,
5)
(Notes 3, 4,
5)
(Notes 3, 4,
5, 6)
(Notes 3, 4,
5, 6)
(Notes 3, 4,
5)
(Notes 3, 4,
5)
(Notes 3, 4,
5, 6)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.
AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
TC = −55˚C
Min Max
TC = +25˚C
Min Max
TC = +125˚C Units Conditions
Min Max
Notes
tPLH Propagation Delay
tPHL Data to Output
0.30 1.80 0.40 1.50 0.40 1.70 ns
(Notes 7, 8,
9, 10, 11)
tPLH Propagation Delay
tPHL Enable to Output
0.60 2.60 0.80 2.30 0.80 2.80 ns
Figures 1, 2
tTLH Transition Time
0.30 1.20 0.30 1.20 0.30 1.20
ns
tTHL 20% to 80%, 80% to 20%
(Note 10)
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
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