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100301F PDF даташит

Спецификация 100301F изготовлена ​​​​«National Semiconductor» и имеет функцию, называемую «Low Power Triple 5-Input OR/NOR Gate».

Детали детали

Номер произв 100301F
Описание Low Power Triple 5-Input OR/NOR Gate
Производители National Semiconductor
логотип National Semiconductor логотип 

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100301F Даташит, Описание, Даташиты
August 1998
100301
Low Power Triple 5-Input OR/NOR Gate
General Description
The 100301 is a monolithic triple 5-input OR/NOR gate. All
inputs have 50 kpull-down resistors and all outputs are
buffered.
Features
n 23% power reduction of the 100101
n 2000V ESD protection
n Pin/function compatible with 100101
n Voltage compensated operating range = −4.2V to −5.7V
n Standard Microcircuit Drawing
(SMD) 5962-9152801
Logic Symbol
Pin Names
Dna, Dnb, Dnc
Oa, Ob, Oc
Oa, Ob, Oc
Description
Data Inputs
Data Outputs
Complementary Data Outputs
DS100302-1
© 1998 National Semiconductor Corporation DS100302
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100301F Даташит, Описание, Даташиты
Connection Diagrams
24-Pin DIP
DS100302-2
24-Pin Quad Cerpak
DS100302-3
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100301F Даташит, Описание, Даташиты
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired
Storage Temperature (TSTG)
Maximum Junction Temperature (TJ)
Ceramic
−65˚C to +150˚C
+175˚C
VEE Pin Potential to
Ground Pin
−7.0V to +0.5V
Input Voltage (DC)
Output Current (DC Output HIGH)
VEE to +0.5V
−50 mA
ESD (Note 2)
2000V
Recommended Operating
Conditions
Case Temperature (TC)
Military
−55˚C to +125˚C
Supply Voltage (VEE)
−5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C
Symbol
VOH
Parameter
Min
Output HIGH Voltage −1025
−1085
Max Units
−870 mV
−870 mV
TC
0˚C to +125˚C
−55˚C
VOL
Output LOW Voltage −1830 −1620 mV
0˚C to +125˚C
−1830 −1555 mV
−55˚C
VOHC
Output HIGH Voltage −1035
−1085
mV 0˚C to +125˚C
mV −55˚C
VOLC
Output LOW Voltage
−1610 mV
−1555 mV
0˚C to +125˚C
−55˚C
VIH Input HIGH Voltage −1165 −870 mV −55˚C to +125˚C
VIL Input LOW Voltage −1830 −1475 mV −55˚C to +125˚C
IIL Input LOW Current 0.50
µA −55˚C to +125˚C
IIH Input HIGH Current
240 µA
340 µA
0˚C to +125˚C
−55˚C
IEE Power Supply
Current
−32 −12 mA −55˚C to +125˚C
Conditions
VIN = VIH(Max) Loading with
or VIL (Min)
50to −2.0V
VIN = VIH(Min)
or VIL (Max)
Loading with
50to −2.0V
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
VEE = −4.2V
VIN = VIL(Min)
VEE = −5.7V
VIN = VIH (Max)
Inputs Open
Notes
(Notes 3, 4, 5)
(Notes 3, 4, 5)
(Notes 3, 4, 5,
6)
(Notes 3, 4, 5,
6)
(Notes 3, 4, 5)
(Notes 3, 4, 5)
(Notes 3, 4, 5)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.
AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
TC = −55˚C
Min Max
TC = +25˚C TC = +125˚C Units
Min Max Min Max
Conditions
Notes
tPLH Propagation Delay
0.25 1.70 0.30 1.50 0.30 1.80 ns
(Notes 7, 8, 9,
tPHL Data to Output
Figures 1, 2 11)
tTLH Transition Time
0.30 1.20 0.30 1.20 0.30 1.20 ns
(Note 10)
tTHL 20% to 80%, 80% to 20%
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
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