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AD53522 PDF даташит

Спецификация AD53522 изготовлена ​​​​«Analog Devices» и имеет функцию, называемую «High Speed Dual Pin Electronic».

Детали детали

Номер произв AD53522
Описание High Speed Dual Pin Electronic
Производители Analog Devices
логотип Analog Devices логотип 

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AD53522 Даташит, Описание, Даташиты
a
High Speed
Dual Pin Electronic
AD53522
FEATURES
1000 MHz Toggle Rate
Driver/Comparator/Active Load and Dynamic Clamp
Included
Inhibit Mode Function
100-Lead LQFP Package with Built-In Heat Sink
Driver
48 Output Resistance
800 ps Tr/Tf for a 3 V Step
Comparator
1.1 ns Propagation Delay at 3 V
Load
؎40 mA Voltage Programmable Current Range
50 ns Settling Time to 15 mV
APPLICATIONS
Automatic Test Equipment
Semiconductor Test Systems
Board Test Systems
Instrumentation and Characterization Equipment
PRODUCT DESCRIPTION
The AD53522 is a complete, high speed, single-chip solution
that performs the pin electronics functions of driver, comparator,
and active load (DCL) for ATE applications. In addition, the
driver contains a dynamic clamp function and the active load
contains an integrated Schottky diode bridge.
The driver is a proprietary design that features three active states:
Data High mode, Data Low mode, and Term mode, as well as
an Inhibit State. In conjunction with the integrated dynamic
clamp, this facilitates the implementation of a high speed active
termination. The output voltage range is –0.5 V to +6.5 V to
accommodate a wide variety of test devices.
The dual comparator, with an input range equal to the driver
output range, features PECL compatible outputs. Signal tracking
capability is in the range of 3 V/ns.
The active load can be set for up to 40 mA load current. IOH, IOL,
and the buffered VCOM are independently adjustable. On-board
Schottky diodes provide high speed switching and low capacitance.
Also included is an on-board temperature sensor that gives an
indication of the silicon surface temperature of the DCL. This
information can be used to measure JC and JA or flag an alarm
if proper cooling is lost. Output from the sensor is a current sink
FUNCTIONAL BLOCK DIAGRAM (One-Half)
VCC VCC VCC
VEE VEE VEE
VH
VTERM
DATA
DATAB
IOD
IODB
RLD
RLDB
VL
PWRD
HCOMP
VCCO
QH
QHB
QL
QLB
LCOMP
AD53522
DRIVER
VCH
VHDCPL
OUT
VLDCPL
VCL
COMPARATOR
VCOM
IOLC
IOXRTN
+1
V/I
ACTIVE LOAD
VCOM_S
INHL
INHLB
IOHC
V/I
1.0A/؇K
PROT_LO
PROT_HI
THERM*
DR_GND GND_ROT PWRGND HQGND THERMSTART
؋9
*ONLY 1 (ONE) THERM PER DEVICE
that is proportional to absolute temperature. The gain is trimmed
to a nominal value of 1.0 µA/K. As an example, the output current
can be sensed by using a 10 kresistor connected from 10 V to
the THERM (IOUT) pin. A voltage drop across the resistor will
be developed that equals 10 kϫ 1 µA/°K = 10 mV/°K = 2.98 V
at room temperature.
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
www.analog.com
Fax: 781/326-8703 © 2003 Analog Devices, Inc. All rights reserved.









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AD53522 Даташит, Описание, Даташиты
AD53522–SPECIFICATIONS
DRIVER1
(TJ = 85؇C ؎ 5؇C, +VS = +10.5 V ؎ 1%, –VS = –4.5 V ؎ 1%, VCCO = 3.3 V, unless otherwise noted.)
Spec
No. Parameter
Conditions
Min Typ2 Max
DIFFERENTIAL INPUT CHARACTERISTICS
(DATA to DATAB, IOD to IODB, RLD to RLDB)
1 Voltage Range
Note: Inputs are from Same Logic
Type Family
2 Differential Voltage with
Note: AC Tests Performed
LVPECL Levels
3 Bias Current
VIN = 1.5 V, 2.5 V
REFERENCE INPUTS
4 Bias Currents
Max Value Measured during
Linearity Tests
0
± 400
–250
± 600
+3.3
± 1000
+250
–50 +50
OUTPUT CHARACTERISTICS
10 Logic High Range
11 Logic Low Range
12 Amplitude [VH–VL]
Data = H, VH = –0.4 V to +6.5 V,
Vl = –0.5 V (VT = 0 V, VH Meets
Test 20, 21, and 22 Specs)
Data = L, VL = –0.5 V to +6.4 V,
VH = 6.5 V (VT = 0 V, VL Meets
Test 30, 31, and 32 Specs)
VL = –0.05 V, VH = +0.05 V,
VT = 0 V and VL = –0.5 V,
VH = +6.5 V, VT = 0 V
–0.4
–0.5
+0.1
+6.5
+6.4
+7.0
ABSOLUTE ACCURACY
20 VH Offset
21 VH Gain Error
22 Linearity Error
30 VL Offset
31 VL Gain Error
32 Linearity Error
33 Offset Temperature Coefficient
Data = H, VH = 0 V, VL = –0.5 V,
VT = +3 V
Data = H, VH = –0.4 V to +6.5 V,
VL = –0.5 V, VT = +3 V
Data = H, VH = –0.4 V to +6.5 V,
VL = –0.5 V, VT = +3 V
Data = L, VL = 0 V, VH = +6.5 V,
VT = +3 V
Data = L, VL = –0.5 V to +6.4 V,
VH = +6.5 V, VT = +3 V
Data = L, VL = –0.5 V to +6.4 V,
VH = +6.5 V, VT = +3 V
VL = 0 V, VH = +5 V, VT = 0 V
–50 +50
–0.3 +0.3
–5 +5
–50 +50
–0.3 +0.3
–5 +5
+0.5
OUTPUT RESISTANCE
40 VH = –0.3 V
41 VH = +6.5 V
42 VL = –0.5 V
43 VL = +6.4 V
44 VH = +2.5 V
50 Dynamic Current Limit
51 Static Current Limit
52 Static Current Limit
VL = –0.5 V, VT = 0 V, IOUT = +1,
+30 mA
VL = –0.5 V, VT = 0 V, IOUT = –1,
–30 mA
VH = +6.5 V, VT = 0 V, IOUT = +1,
+30 mA
VH = +6.5 V, VT = 0 V, IOUT = –1,
–30 mA
VL = 0 V, VT = 0 V, IOUT = –30 mA
(Trim Point)
Cbyp = 39 nF, VH = +6.5 V,
VL = –0.5 V, VT = 0 V
Output to –0.5 V, VH = +6.5 V,
VL = –0.5 V, VT = 0 V, DATA = H
Output to +6.5 V, VH = +6.5 V,
VL = –0.5 V, VT = 0 V, DATA = L
+46 +50
+46 +50
+46 +50
+46 +50
+47.5
+100
–120
–60
+60 +120
Unit
Spec3
Perf
VN
mV P
µA P
µA P
VP
VP
VP
mV P
% of VH P
mV P
mV P
% of VL P
mV P
mV/°C N
N
P
P
N
P
mA N
mA P
mA P
–2– REV. A









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AD53522 Даташит, Описание, Даташиты
AD53522
DRIVER1 (continued)
Spec
No. Parameter
Conditions
Min Typ2
VTERM
60 Voltage Range
61 VTERM Offset
62 VTERM Gain Error
63 VTERM Linearity Error4
64 Offset Temperature Coefficient
70 Output Resistance DC
72 PSRR, Drive, or Term Mode
73 Static Current Limit
74 Static Current Limit
Term Mode, VTERM = –0.3 V
–0.3
to +6.3 V, VL = 0 V, VH = +3 V
(VTERM Meets Test 61, 62, and 63 specs)
Term Mode, VTERM = 0 V,
–50
VL = 0 V, VH = +3 V
Term Mode, VTERM = –0.3 V
–0.3
to +6.3 V, VL = 0 V, VH = +3 V
Term Mode, VTERM = –0.3 V
–5
to +6.3 V, VL = 0 V, VH = +3 V
VTERM = 0 V, VL = 0 V, VH = +3 V
IOUT = +30 mA, –1 mA,
+46
VTERM = –0.3 V, VH = +3 V, VL = 0 V
IOUT = –30 mA, +1 mA,
VTERM =+6.3 V, VH = +3 V, VL = 0 V
IOUT = ± 30 mA, ± 1 mA,
VTERM = +2.5 V, VH = +3 V, VL = 0 V
+VS , –VS ± 1%
Output to –0.3 V, VTERM = +6.3 V
–120
Output to +6.3 V, VTERM = –0.3 V +60
+0.5
+17.8
DYNAMIC PERFORMANCE, DRIVE (VH and VL)
80 Propagation Delay Time
Measured at 50%, VL = 0 V,
VH = 3 V, into 500
81 Propagation Delay T.C.
Measured at 50%, VL = 0 V,
VH = 3 V, into 500
82 Delay Matching, Edge-to-Edge Measured at 50%, VL = 0 V,
VH = 3 V, into 500
1.25 1.4
2
RISE AND FALL TIMES
90 200 mV Swing
91 1 V Swing
92 3 V Swing
93 3 V Swing
93A 3 V Swing
94 5 V Swing
Measured 20%–80%, VL = –0.1 V,
VH = +0.1 V, into 50
Measured 20%–80%, VL = 0 V,
VH = 1 V, into 50
Measured 10%–90%, VL = 0 V,
VH = 3 V, into 50
Measured 10%–90%, VL = 0 V,
VH = 3 V, into 500
Measured 20%–80%, VL = 0 V,
VH = 3 V, into 500
Measured 10%–90%, VL = 0 V,
VH = 5 V, into 500
0.25
0.3
0.8
0.8
0.450 0.560
1.2
RISE AND FALL TIME TEMPERATURE COEFFICIENT
100 1 V Swing
(Per Test 91)
101 3 V Swing
(Per Test 92)
102 5 V Swing
(Per Test 94)
110 Overshoot and Preshoot
VL, VH = –0.1 V, +0.1 V,
Driver Terminated into 50
VL, VH = 0.0 V, 3 V,
Driver Terminated into 50
0 – 50
±2
±2
±4
–6.0 – 50
SETTLING TIME
120 to 15 mV
121 to 4 mV
130 Delay Change vs. Pulse Width
131 Delay Change vs. Duty Cycle
VL = 0 V, VH = 0.5 V,
Driver Terminated into 50
VL = 0 V, VH = 0.5 V
VL/VH = 0/3, PW = 2.5 ns/7.5 ns,
30 ns/90 ns, DC = 25%
VL = 0 V, VH = 3 V, Duty Cycle
(DC) 5% to 95%, T = 40 ns
50
10
25
25
Max Unit
+6.3 V
Spec3
Perf
P
+50
+0.3
+5
+50
–60
+120
mV P
% of VSET P
mV P
mV/°C
N
N
N
mV/V
mA
mA
P
N
P
P
1.55 ns
P
ps/°C N
200 ps
P
0.670
1.5
ns
ns
ns
ns
ns
ns
N
N
N
N
P
N
ps/°C N
ps/°C N
ps/°C N
0 + 50 % of Step N
+ mV
+6.0 + 50 % of Step N
+ mV
ns
µs
75 ps
ps
N
N
N
N
REV. A
–3–










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